Highlights
| Description | Antaris MX FT-NIR Process Analyzer |
| Analyzer Type | Fourier Transform Near-Infrared |
| Detection | High sensitivity, high stability matched InGaAs |
| Height (English) | 18.97 x 15.98 x 9.72 in. |
| Height (Metric) | 48.2 x 40.6 x 24.7 cm |
| Interface | Direct PC to ethernet allows file system and OPC communications |
| Interferometer | Proven, frictionless, stable, long-life Michelson |
| Operating Temperature Range | 15°C to 35°C (59° to 95°F) |
| Photometric Linearity | Slope 1.0 ±0.05 and an intercept of 0.0 ±0.05 |
| Resolution | 4 cm-1 across spectral range (0.6 nm at 1250 nm), 2 cm-1 option across spectral range (0.3 nm at 1250 nm) |
| Sampling Mode | Fiber optic multiplexing |
| Sealed and Desiccated | Yes |
| Source Type | Long-life, high-intensity halogen NIR source; spare source included with system, guaranteed filament image alignment |
| Spectral Range | 12,000 to 3800 cmto1 (833 to 2500 nm) |
| System Status Indicators | Indicator lights report scan, laser, power, and source status continuously |
| Voltage | 90/264 V |
| Wavenumber Accuracy | ±0.1 cm-1 (0.02 nm at 1250 nm) |
| Wavenumber Repeatability | (System to System) Better than 0.05 cm-1 (0.008 at 1250 nm) |
| Wavenumber Reproducibility | (Single System) 10 measurement standard deviation <0.006cm-1 |
| Weight (English) | 105.16 lb. |
| Weight (Metric) | 25.8 kg |
